1 年
高级会员
已认证
DAGE4300FP半自动晶圆凸块测试系统
报价:面议
品牌: |
Nordson DAGE |
产地: |
英国 |
关注度: |
1390 |
型号: |
DAGE4300FP |
产品介绍
4300FP - Semi-automatic Wafer Bump Testing
The Nordson DAGE 4300FP eliminates manual handling of expensive wafers. It improves cleanliness through isolation of bondtester and wafer handler and increases productivity through semi-automatic testing.
Shear testing using Nordson DAGE's patented air bearing frictionless intelligent load cell system
Fully automatic wafer handling via customer's third party robot handler (SMIF/FOUP) equipment
Wafer handler and bondtester can operate in isolated environment with minimum operator interaction
Joystick manipulation of 100% of wafer surface under test head without repositioning of wafer
Semi-automatic test routines using 2 reference points (no camera system required) per wafer enable bondtesting to the entire wafer surface without repositioning
460mm x 300mm XY stage with robot compatible chuck. Pneumatically operated pins allow wafer exchange using a robot handler
360 degree load tool rotation - optional
Automatic calibration and linearity checks
Integrated analysis including statistics and SPC functions
ODBC compliant
问商家
- DAGE4300FP半自动晶圆凸块测试系统的工作原理介绍?
- DAGE4300FP半自动晶圆凸块测试系统的使用方法?
- DAGE4300FP半自动晶圆凸块测试系统多少钱一台?
- DAGE4300FP半自动晶圆凸块测试系统使用的注意事项
- DAGE4300FP半自动晶圆凸块测试系统的说明书有吗?
- DAGE4300FP半自动晶圆凸块测试系统的操作规程有吗?
- DAGE4300FP半自动晶圆凸块测试系统的报价含票含运费吗?
- DAGE4300FP半自动晶圆凸块测试系统有现货吗?
- DAGE4300FP半自动晶圆凸块测试系统包安装吗?
聚擘国际贸易(上海)有限公司为您提供Nordson DAGEDAGE4300FP半自动晶圆凸块测试系统,DAGE4300FP半自动晶圆凸块测试系统产地为英国,属于测量/计量仪器,除了DAGE4300FP半自动晶圆凸块测试系统的参数、价格、型号、原理等信息外,还可为您提供BTU回流焊炉、时间分辨光致发光瞬态光栅光谱仪、DAGE X光检测系统Quadra 5。