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参考报价：电议 型号：
产地：法国 在线咨询
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为满足广大客户在真空环境中对激光光束质量，气流，等离子体密度测量分析，以及光学系统装配的需求。法国phasics推出了新型高精度波前分析仪sid4-v，是目前市场上仅有一款可应用于真空度在10-6 mbar环境中的波前分析仪，广泛应用于高功率激光测试中。
产品特点：
可适用于＞10-6mbar真空环境
高分辨率160×120相位像素
光谱范围从400 nm到1100 nm
可测量发散光束
热和机械真空不改变测试结果
真空循环下无任何性能下降
真空和常压下均可使用
产品参数：
真空相容性 | 10-6mbar |
波长范围 | 400 - 1100 nm |
通光孔径 | 3.6 x 4.8 mm2 |
空间分辨率 | 29.6 μm |
采样点（相位/强度） | 160 x 120 (> 19 000 points) |
相位相对灵敏度 | < 2 nm rms |
相位精度 | 10 nm rms |
动态范围 | > 100 μm |
采样频率 | > 100 fps |
实时分析频率 | > 10 fps (full resolution) |
数据接口 | giga ethernet |
尺寸(w x h x l) | 54 x 46 x 75.3 mm |
重量 | ~250 g |
关于phasics：法国phasics公司自主研发的波前传感器是基于其**的四波横向剪切干涉技术。相较传统的夏克-哈特曼波前探测器具有高分辨率、消色差、高灵敏度、高动态检测范围、操作简便等独特的优势。为波前像差、波前畸变的检测以及激光光束及波前的测量、分析等提供了全新的解决方案。 法国phasics波前传感器生产厂家具有雄厚的技术研发实力，能为客户提供的各种自适应光学系统oa-sys，制定个性化解决方案。可根据客户的应用需求。
波前分析仪主要应用领域：
1. 激光光束参数测量：相位（2d/3d），m2，束腰位置，直径，泽尼克/勒让德系数
2. 自适应光学：焦斑优化，光束整形
3. 元器件表面质量分析：表面质量（rms，ptv，wfe），曲率半径
4. 光学系统质量分析：mtf， psf， efl， 泽尼克系数， 光学镜头/系统质量控制
5. 热成像分析，等离子体特征分析
6. 生物应用：蛋白质等组织定量相位成像
Phasics is innovating by proposing the first off-the-shelf vacuum compatible wavefront sensor on the market. The SID4 Vis designed to perform wavefront measurements under high vacuum. the wavefront measurement is realized in-situ in the same condition as the experiment. Our new SID4 V vacuum wavefront sensor is also used to characterize laser beams after compression inside the compressor vessel. Finally， gas jet and plasma density are now measured as close to the target as possible.
BENEFITS: With Phasics’s unique strategy it’s now possible to correct the aberrations of every single optical element up to the target location inside the vacuum chamber.
VACUUM COMPATIBLE & HIGH RESOLUTION | DESIGNED FOR VACUUM DOWN TO 10-6 mbar
Vacuum compatibility > 10-6 mbar
High resolution 160 x 120 phase pixels
Spectral range from 400 nm to 1100 nm
Diverging beam compatible
Invariant to thermal and mechanical vacuum constraints
Tolerates vacuum-cycles without any performance decrease
Both functional under vacuum and atmospheric pressure
Low outgassing
| Vacuum compatibility | > 10-6 mbar |
| Wavelength range | 400 - 1100 nm |
| Aperture dimension | 4.73 x 3.55 mm2 |
| maximum NA (optional software necessary) | 0.2 |
| Spatial resolution | 29.6 μm |
| Phase & intensity sampling | 160 x 120 |
| Accuracy | 15 nm RMS |
| Resolution (Phase) | 2 nm RMS |
| Acquisition rate | 60 fps |
| Real-time processing frequency | 7 Hz (full resolution) |
| Interface | Giga Ethernet |
| MTBF | > 10 years |
| Dimensions (w x h x l) | 54 x 46 x 75.3 mm |
| Weight | ~ 250 g |
SID4 DENSITY software package supports the whole process to measure gas and plasma electron density. It calculates density maps from phase acquisition. It also offers various options for acquisition and data analysis.
| WORKING CONDITIONS | |
| Application | Any axisymmetric monoatomic gas jet/plasma for inverse-Abel transform analysis |
| Probe source | White light (halogen)， LED， laser or fs-laser |
| Pressure | From 2 to 300 bars |
| Plasma length | Depends on the imaging system (typically 2 mm long and diameter of 0.2 mm) |
| SOFTWARE | |
| Acquisition | Real Time， programmed， trigger |
| Settings | Wavelength， magnification， jet direction， gas type |
| Analysis | Density map & profiles， Symmetrization， filters |
Performances such as the spatial resolution or the density resolution entirely depend on both the optical set-up (imaging system， probe source) and the injected gas (molar refractivity). Please contact us for an estimation of specifications for your set-up.
As an example， for an laser produced plasma using an Argon gas jet at working pressure between 2 and 300 bars， the lowest measured Argon density in a single shot is: 1017 particles/cm3 with a nozzle of 1.5 mm diameter.
